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        儀器設備

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        JSM-IT300型掃描電子顯微鏡

        作者:        發布于:2018-05-23
        測試中心冊子11.30_頁面_08_圖像_0002.jpg
         
         
        型號:JSM-IT300
         

        生產國別廠家:日本電子株式會社

         

        主要技術指標:二次電子像分辨率:3.0nm; 背散射電子像分辨率:4.0nm

         

        放大倍數范圍X5X300,000

         

        加速電壓:0.3kV30kV

         

        圖像種類:二次電子像、背散射電子像

         

        儀器簡介:掃描電子顯微鏡是利用電子槍射出的高能電子束,在試樣表面作行幀掃描,激發出各種物理信號,這些信號的強度取決于試樣表面的形貌、成分和晶體取向等特征。信號經過放大處理后由顯示器給出反映試樣表面特征的掃描電子圖像,JSM-IT300掃描電子顯微鏡主要用于試樣表面的分析與觀察,已經成為材料學、生命科學和產業部門質量控制中不可缺少的工具。

         

        X射線能譜分析系統(能譜儀)

         

        型號:Aztec Energy Standard X-MaxN20

         

        生產國別廠家:牛津公司

         

        分辨率:優于127eV

         

        元素探測范圍:Be4–U92

         

        主要用途:元素的定性、定量分析,面分布及圖像處理,牛津能譜儀是具有圖像及成分圖的能譜分析系統,具有分辨率高和定性、定量準確等特點。

         

          

        Model: JSM-IT300

        Manufacturer: JEOL Ltd.Japan

        Main specificationsHV Model Resolution: 3.0nm in SEI ; 4.0nm in BEI

        Magnification: X5X300,000

        Accelerating voltage: 0.3kV30kV

        Scanning electron microscope is imaging technique of revealing the surface topography of a Specimen when a electron beam with a high energy emitted from an electron gun is incident upon the surface by frame frequency scanning. Secondary electrons and back scattered electrons containing all kinds of physical information are excited from the surface. The intensities of secondary electrons and back scattered electrons depend on the surface morphology, element and crystal orientation. When the signals of secondary electrons and back scattered electrons are amplified, the terminal of a computer will display an image of the reflecting surface characteristics of the specimen. Model JSM-IT300 scanning electron microscope is mostly applied in observing the surface topography and it has been an important implement in materials science, biological science and all industrial departments. JSM-IT300 scanning electron microscope can be used for nonconductive samples directly, and mining industry. Biological samples, such as tissue fat,flower powder and rhizome, etc., can be observed directly after special and simple preparation.

        EDS is used on JSM-IT300 as its accessory

        Model: Aztec Energy Standard X-MaxN20

        Manufacturer: Oxford Instruments

        Main specificationsResolution:127eV

        Element probing range: Be4–U92.

        Main applications:Quantitaive and qualitative analysis of elements, particle analysis, phase distribution and image handling.

        Phoenix EDS provides an image and composition graph with a best resolution and high accuracy.

         

         

         

         

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